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Metrology for photovoltaics

SE 400adv PV

The SE 400adv PV is the globally used standard tool for determining thickness and refractive index of single layer antireflective coatings for PV. Especially SiNx AR single films on textured monocrystalline and multicrystalline silicon solar cells can be characterized. Systems are used for quality control of SiNx coatings and thin passivation layers of SiO2 and Al2O3

SE 800 PV

SENTECH designed the SE 800 PV for characterizing multilayers composed of SiNx / SiO2, SiNx / SiNy, or SiNx / Al2O3 as passivation and antireflective coatings. Refractive index, absorption and film thickness of the stacked layers are analysed on textured monocrystalline and multicrystalline silicon solar cells. The complex measurement is performed in the recipe mode, fast and easily.