NanoFrazor Explore from HEIDELBERG INSTRUMENTS NANO (SwissLitho AG).
The NanoFrazor Explore performs with maximum speed, precision and reliability. The technology behind the system is the result of more than 20 years of intensive research and development that started at IBM Research in Zurich and has been extended at SwissLitho and Heidelberg Instruments.
The NanoFrazor Explore is equipped with the most advanced hard- and software to control the heatable NanoFrazor cantilevers in the best possible manner for writing and imaging. Recently, the Explore has received an integrated laser writer extension to speed up patterning of coarse features. Nano- and microfeatures can now be seamlessly and quickly written into the same resist layer using the same software platform in a single fabrication step.
Application NanoFrazor:
● MEMS
● Nanolithography
● Nanomagnets
● Nanoelectronics
● Plasmonics
● Semiconductors
● Maskless nanopattering
● Prototiping
● Nanoimprint stamps
Writing performance | Thermal probe pattering | Direct Laser Sublimation |
Max sample size (XYZ) | 100 х 100 х 20 мм | |
Material | any (1) | |
Pettering | ||
Minimum structure size [nm] | 15 | 600 |
Minimum lines and spaces [half pitch, nm] | 25 | 1000 |
Grayscale / 3D-resolution (step size in PPA) [nm] | 2 | - |
Write speed (typical scan speed) [mm/s] | 1 | 5 |
Write speed (thermal Probe: 50 nm pixel, incl. imaging) [μm2/min] | 100 | 100 000 |
Field stitching accuracy (markerless, using in-situ AFM imaging) [nm] | 25 | 300 |
Overlay accuracy (markerless, using in-situ AFM imaging) [nm] | 25 | 100 |
Writing field size [X μm x Y μm] |
60 х 60 | 60 х 60 |
AFM imaging performance | ||
Lateral imaging resolution (feature size) [nm] | 10 | |
Vertical resolution (topography sensitivity) [nm] | 0,2 | |
Imaging speed (50 nm pixel) [μm2/min] | 1000 мкм2/мин |