NanoFrazor Scholar from HEIDELBERG INSTRUMENTS NANO (SwissLitho AG, Швейцария).
NanoFrazor lithography – based on thermal Scanning Probe Lithography developed at IBM Research – is the fastest and most versatile of all Scanning Probe Lithography techniques.
The NanoFrazor Scholar is the entry level NanoFrazor system and is particularly suited for academic research groups looking for an easy way to create high-resolution nanopatterns or devices. The NanoFrazor Scholar is a compact system designed to fit in the smallest lab spaces. It can also be installed in a dedicated glovebox to enable nanolithography of sensitive materials in inert conditions.
Like all NanoFrazor tools, the Scholar can pattern features with ultra-high resolution with no need for proximity effect corrections. All the unique NanoFrazor capabilities like in-situ AFM imaging, accurate 3D grayscale lithography, markerless overlay or thermal material conversion are available with the Scholar.
Application NanoFrazor:
● MEMS
● Nanolithography
● Nanomagnets
● Nanoelectronics
● Plasmonics
● Semiconductors
● Maskless nanopattering
● Prototiping
● Nanoimprint stamps
Samples | |
Sample size (XYZ) | 50 х 50 х 20 mm |
Writing performance | |
Minimum structure size [nm] | 20 nm |
Minimum lines and spaces [half pitch, nm] | 30 nm |
Grayscale / 3D-resolution (step size in PPA) [nm] | < 3 nm |
Write speed (typical scan speed) [mm/s] | 0.5 mm/sec |
Writing field size [X μm x Y μm] |
up to 50 х 50 microns |
AFM imaging performance | |
Lateral imaging resolution (feature size) [nm] | < 10 nm |
Vertical resolution (topography sensitivity) [nm] | 0.2 nm |
Imaging speed (@ 50 nm resolution) [μm2/min] | 500 |